Universal Semiconductor Device Tester FORMULA TT3 for Automated Measurements

FORMULA TT3 tester is a universal test and measurement system designed for complex automated testing of static parameters of semiconductor devices: field and bipolar transistors, diodes, thyristors, stabilitrons, optrons, micro assemblies, as well as:
- Capacitance measurement: input capacitance, pass capacitance, output capacitance for field-effect transistors,
- Charge measurement: gate-to-drain, gate-to-drain and total charge for field-effect transistors,
- Measurement of passive components (L,C,R).

The field of application of the Testers is testing and quality control at all stages of the semiconductor devices life cycle, including:
- testing and research of newly developed types of semiconductor devices,
- production and acceptance tests of serial products: qualification,
- periodic, rejection, acceptance and acceptance tests,
- certification tests,
- incoming inspection.