Functional and Parametric Testing System Tester FORMULA HF3 for Integrated Circuits

FORMULA HF3 tester is designed for functional and parametric control of fast VLSI of a wide range of nomenclature: microcontrollers, static and dynamic memory, VLSI on BMK, ASICs, FPGAs, etc. with the number of signal pins up to 256 and frequency of operation up to 200 MHz.

The field of application of the Testers is testing and quality control at all stages of the VLSI life cycle, including:
- testing and research of newly developed types of microcircuits
- production and acceptance tests of serial products: qualification tests,
- periodic, rejection, acceptance tests
- certification tests
- incoming inspection