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Functional and Parametric Testing System Tester FORMULA HF3 for Integrated Circuits
Manufacturer:
FORM LLC
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Description
FORMULA HF3 tester is designed for functional and parametric control of fast VLSI of a wide range of nomenclature: microcontrollers, static and dynamic memory, VLSI on BMK, ASICs, FPGAs, etc. with the number of signal pins up to 256 and frequency of operation up to 200 MHz.
The field of application of the Testers is testing and quality control at all stages of the VLSI life cycle, including:
- testing and research of newly developed types of microcircuits
- production and acceptance tests of serial products: qualification tests,
- periodic, rejection, acceptance tests
- certification tests
- incoming inspection
The field of application of the Testers is testing and quality control at all stages of the VLSI life cycle, including:
- testing and research of newly developed types of microcircuits
- production and acceptance tests of serial products: qualification tests,
- periodic, rejection, acceptance tests
- certification tests
- incoming inspection
Specifications
Vector memory capacity per channel
??67 108 864? pcs
Dynamic active load
Armoured glass
Comprehensive automated verification of digital microchips of large and ultra-large integration degree, including microcircuits
Armoured glass
Control and measurement of microcircuits on the wafer and in the case during the development, testing, production and operation
Armoured glass
Error memory capacity (comparator response memory) per channel
??67 108 864? pcs
Active load current
0;0005...0;025 A
Minimum pulse duration
0;0015...0;0018
Absolute error of time stamp formation
?0;0007
Measurement and reproduction of DC current strength by power supplies
?4 A
Reproduction and measurement of DC power by a static meter
?0;15 A
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