Multifunctional Defectoscope DАMI-C09 for Measuring Defects

Defectoscope multifunctional DAMI-S09 is designed for: -measurement of area and coordinates of defects with the help of obtained two-dimensional images; -control by impedance method - for detection of defects such as delamination and non-glueing in glued, soldered multilayer structures, as well as structures with honeycomb filling; -control by eddy current method - for detection of surface cracks and non-flaws in parts made of non-magnetic and ferromagnetic metals and alloys; - inspection by impact method - for detection of defects such as delaminations and non-glues in complex composite materials; - light and sound signalling of defect detection in the process of inspection; - construction of defect projections on the inspection surface in the form of two-dimensional images; - accumulation and saving of results in the process of inspection with the purpose of their subsequent rewriting in a computer data bank or presentation in the form of a document. DAMI-S09 is a small-sized portable device and is designed for manual inspection.