High-Energy Microsecond Impulse Interference Generator IGM 4.1 for Testing Applications

Test generator IGM 4.1 is designed to create standardised microsecond pulse interference (MIP) of high energy in power supply and data transmission circuits, when testing technical means (hereinafter "TS"), which may be exposed to MIP according to GOST R 51317.4.5-99, GOST IEC 61000-4-5-2017, GOST R 50009-2000, IEC 61000-4-5-95.The test generator IGM 4.1 is supplied with an in-built communication-decoupling device (CDD) designed for introducing the IPI into single-phase AC power supply circuits of TCs with voltage 220V and current consumption up to 10A.