FUNCTIONAL AND PARAMETRIC TESTER FORMULA HF3-512 for SBIS Applications

FORMULA HF3-512 tester is designed for functional and parametric control of fast-acting VLSI of wide nomenclature: microcontrollers, static and dynamic memory, VLSI on BMK, ASICs, FPGAs, etc. with the number of signal pins up to 512 and frequency of operation up to 200 MHz. up to 200 MHz.

The field of application of Testers is testing and quality control at all stages of the VLSI life cycle, including: <ul> <li>- Testing and research of newly developed types of microcircuits</li> <li>Production and acceptance testing of serial products: qualification tests</li> <li>periodic, rejection, acceptance tests</li> <li>Certification testing</li> <li>Input control</li> </ul>